Xstress G2R

X-ray diffractometer Xstress G2R represents advances in design and construction, which provide enhanced reliability and function in a truly portable residual stress and retained austenite analyzer. Bi-axial and tri-axial stress state analysis is effortless and automated with rotating diffractometer.

• Non-destructive
• Suitable for laboratory, factory and ­field use
• Rotating diffractometer enables bi-axial and tri-axial stress state analysis
• Quick assembly, ready to use in 10 minutes
• Easy replacement of X-ray tube (Cr, Cu, Co, Fe, V, Ti, Mn) which enables measuring different materials
• Measurement distance 50 mm
• Two NMOS position sensitive detectors
• Instantly adjustable 2θ-angle
• XTronic software for running the measurement and calculating residual stresses and retained austenite content (optional)
• d-sin²χ and Ω-measurement modes as a standard

Features

Two symmetrically positioned NMOS position sensitive detectors

• standard detector width 15°
• for other detectors see options

2θ-range of the detectors

• continuously adjustable within 110° to 165°
• lower angles as option with special detector arcs

Standard measurement distance 50 mm

Replaceable collimators

• 1/2/3/4/5 mm spot sizes
• special collimators available as an option

X-ray tube

• Cr-tube as standard: max. output 30 kV/9 mA/270 W

Automated rotation unit

• Rotation angle range +/-180°
• Rotation oscillation, automatically selectable +/-180°

Xstress main unit (high voltage generator)

• X-ray power supply 5–30 kV/0–10 mA freely adjustable within limits

• self-contained liquid cooling system

• includes all interlocks required for complete safety
• universal power input

XTronic software

• fully featured Windows software using thread based multi-tasking
• hardware operation control: detectors, DC motors, power supply, shutter, safety interlock functions, voltage and current, etc.
• automated calibration with zero stress powder samples to set diffractometer to sample distance
• project manager for depth distribution measurement and all kinds of mapping measurements
• library functions for material parameters
• modified d-sin2χ and Ω-mode
• peak shift determination with the most known methods such as cross-correlation and peak fit methods
• peak fit with eight different functions and three background options: Gauss, Lorentz, Modified Lorentz, Intermediate Lorentz, Pearson VII, Split Pearson VII, Pseudo-Voigt and Split Pseudo-Voigt

Safety

ANSI N43.3 – 1993

• Meets or exceeds ANSI N43.3 – 1993 and other industry standards for open beam X-ray operation.
• X-ray diffractometer safety regulations in general