Xstress Studio
Xstress Studio
- Hardware operation control: detectors, DC motors, power supply, shutter, safety interlock functions, voltage and current, etc.
- Automated calibration with zero stress powder samples to set diffractometer to sample distance
- Project manager for depth distribution measurement and all kinds of mapping measurements
- Library functions for material parameters
- Theoretical peak position calculator for given material and radiation
- Modified χ and Ω measurement modes
- Peak shift determination with the most known methods such as cross-correlation and peak fit methods
- Peak fit with 10 different functions: Gauss, Lorentz, Modified Lorentz, Intermediate Lorentz, Pearson VII, Split Pearson VII, Pseudo-Voigt, Split Pseudo-Voigt, Voigt and Split Voigt
- Calculation of stress tensor and principal stresses
- JSON based project file format
- Conforming to EN 15305:2008
- Calculation methods
- Data preparation
- Peak
- Peak shift (diffraction line position determination)
- Normal and shear stress
- Stress tensor
- Principal stresses
- Statistics
- Depth profile